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Surface analysis systems are devoted to the detailed investigation of the elemental composition of the outermost atomic layer of a solid to determine the chemical binding state, the precise sites of atoms in relation to the crystal structure, the surface morphology and the states of adsorbates.
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Critical to the success of surface analysis is the maintenance of ultra high vacuum conditions during the experimental studies. This is because the superficial layers of the materials to be analyzed are easily contaminated by the outgassing of the chamber and of the equipment installed in it (gauges, RGAs) and also by leaks coming from the load-lock chamber.
These ultra high vacuum conditions are usually obtained with the use of UHV pumps of the “Capture” type, such as Sputter-Ion pumps. However, the need to further improve the ultimate vacuum of the equipment has prompted the use of additional pumping devices.
SAES Getters Non-Evaporable Getter pumps represent the ideal solutions to boost the vacuum performance and to achieve overall lower pressures and cleaner test conditions. Thanks to their compact size and to the availability of different configurations, they can be easily retrofitted on general Surface Science systems and provide a longer and more stable pumping effect.
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SAES NEG pumps, such as the Cartridge and CapaciTorr, are particularly suited in providing additional pumping very close to the sample area. This is due to the fact that, unlike the once used Titanium Sublimation pumps, they do not require any sublimation or evaporation of material which can contaminate the sample.
In addition, SAES Getter Wafer Modules are integrated directly into the Sputter Ion Pump, a solution proposed by the ion pump manufacturers themselves.
Boost your product performance with SAES Getters solutions:
- CapaciTorr Pumps
- SORB-AC Cartridge Pumps
- SORB-AC Getter Wafer Module
Browse the Product Box for further details.
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